EAN: 9783031410925

SPRINGERBRIEFS IN MATERIALS POSITRON PROFILOM...

This book provides a comprehensive overview of positron profilometry  specifically focusing on
the analysis of defect depth distribution in materials. Positron profilometry plays a crucial
role in understanding and characterizing defects in a wide range of materials  including metals
semiconductors  polymers  and ceramics. By analyzing the depth distribution of defects 
researchers can gain insights into various material properties  such as crystal structure 
defect density  and diffusion behavior. The author's extensive research spanning a period of
two decades has primarily centered on subsurface zones. These regions  located beneath the
surface and subjected to various surface processes  play a crucial role in generating defect
distributions. Three experimental techniques and their data analysis are described in detail: a
variable-energy positron beam (VEP) called sometimes a slow positron beam  a technique called
implantation profile depth scanning (DSIP)  and a sequential etching (SET) technique. The
usability of these techniques is illustrated by many examples of measurements by the author and
others.

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