VLSI Design and Test Kartoniert (TB)

This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test VDAT 2017 held in Roorkee India in June July 2017. The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were organized in topical sections named: digital design analog mixed signal VLSI testing devices and technology VLSI architectures emerging technologies and memory system design low power design and test RF circuits architecture and CAD and design verification.