VLSI Design and Test Kartoniert (TB)

This book constitutes the refereed proceedings of the 22st International Symposium on VLSI Design and Test VDAT 2018 held in Madurai India in June 2018. The 39 full papers and 11 short papers presented together with 8 poster papers were carefully reviewed and selected from 231 submissions. The papers are organized in topical sections named: digital design analog and mixed signal design hardware security micro bio-fluidics VLSI testing analog circuits and devices network-on-chip memory quantum computing and NoC sensors and interfaces.