Analog Signal Generation for Built-In-Self-Test (BIST) of Mixed-Signal Integrated Circuits is a
concise introduction to a powerful new signal generation technique. The book begins with a
brief introduction to the testing problem and a review of conventional signal generation
techniques. The book then describes an oversampling-based oscillator capable of generating
high-precision analog tones using a combination of digital logic and D A conversion. These
concepts are then extended to multi-tone testing schemes without introducing a severe hardware
penalty. The concepts are extended further to encompass piece-wise linear waveforms such as
square triangular and sawtooth waves. Experimental results are presented to verify the ideas
in each chapter and finally conclusions are drawn. For those readers unfamiliar with
delta-sigma modulation techniques a brief introduction to this subject is also provided in an
appendix. The book is ideal for test engineers researchers and circuits designers with an
interest in IC testing methods.
