Modeling Nanoscale Imaging in Electron Microscopy presents the recent advances that have been
made using mathematical methods to resolve problems in microscopy. With improvements in
hardware-based aberration software significantly expanding the nanoscale imaging capabilities
of scanning transmission electron microscopes (STEM) these mathematical models can replace
some labor intensive procedures used to operate and maintain STEMs. This book the first in its
field since 1998 will also cover such relevant concepts as superresolution techniques special
denoising methods application of mathematical statistical learning theory and compressed
sensing.
