The chapters in this edited book are written by some authors who have presented very high
quality papers at the 2015 International Symposium of Next-Generation Electronics (ISNE 2015)
held in Taipei Taiwan. The ISNE 2015 was intended to provide a common forum for researchers
scientists engineers and practitioners throughout the world to present their latest research
findings ideas developments and applications in the general areas of electron devices
integrated circuits and microelectronic systems and technologies. The scope of the conference
includes the following topics:A. Green ElectronicsB. Microelectronic Circuits and SystemsC.
Integrated Circuits and Packaging TechnologiesD. Computer and Communication EngineeringE.
Electron DevicesF. Optoelectronic and Semiconductor TechnologiesThe technical program consisted
of 4 plenary talks 23 invited talks and more than 250 contributed oral and poster
presentations. Plenary speakers were recognized experts in their fields and their talks
focused on leading-edge technologies including:The Future Lithographic Technology for
Semiconductor Fabrication by Dr. Alek C. Chen Asia ASML Taiwan.Detection of Single Traps and
Characterization of Individual Traps: Beginning of Atomistic Reliability Physics by Prof.
Toshiaki Tsuchiya Shimane University Japan.The Art and Science of Packaging High-Coupling
Photonics Devices and Modules by Prof. Wood-Hi Cheng National Chung-Hsing University
Taiwan.Prospect and Outlook of Electrostatic Discharge (ESD) Protection in Emerging
Technologies by Prof. Juin J. Liou University of Central Florida USA.After a rigorous review
process the ISNE 2015 technical program committee has selected 10 outstanding presentations
and invited the authors to prepare extended chapters for inclusion in this edited book. Of the
10 chapters five are focused on the subject of electronic devices and the other covers the
circuit designs for various applications. The authors are working at the academia in Austria
United States Korea and Taiwan. The guest editors would like to take this opportunity to
express our sincere gratitude to all the members of the ISNE 2015 technical program committees
for reviewing the papers and selecting the manuscripts for the edited book. We also thank all
the authors for their valuable and excellent contributions to the book.
