This book presents the state-of-the art of one of the main concerns with microprocessors today
a phenomenon known as dark silicon. Readers will learn how power constraints (both leakage and
dynamic power) limit the extent to which large portions of a chip can be powered up at a given
time i.e. how much actual performance and functionality the microprocessor can provide. The
authors describe their research toward the future of microprocessor development in the dark
silicon era covering a variety of important aspects of dark silicon-aware architectures
including design management reliability and test. Readers will benefit from specific
recommendations for mitigating the dark silicon phenomenon including energy-efficient
dedicated solutions and technologies to maximize the utilization and reliability of
microprocessors.
