EAN: 9783319912035

MULTI-RUN MEMORY TESTS FOR PATTERN SENSITIVE FA...

This book describes efficient techniques for production testing as well as for periodic
maintenance testing (specifically in terms of multi-cell faults) in modern semiconductor
memory. The author discusses background selection and address reordering algorithms in
multi-run transparent march testing processes. Formal methods for multi-run test generation and
many solutions to increase their efficiency are described in detail. All methods presented
ideas are verified by both analytical investigations and numerical simulations. Provides the
first book related exclusively to the problem of multi-cell fault detection by multi-run tests
in memory testing process  Presents practical algorithms for design and implementation of
efficient multi-run tests  Demonstrates methods verified by analytical and experimental
investigations.

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