This book explains the operating principles of atomic force microscopy and scanning tunneling
microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope
successfully and understand the data obtained with the microscope. The chapters on the scanning
probe techniques are complemented by the chapters on fundamentals and important technical
aspects. This textbook is primarily aimed at graduate students from physics materials science
chemistry nanoscience and engineering as well as researchers new to the field.
