The state of the art in optical characterization of materials is advancing rapidly. New
insights into the theoretical foundations of this research field have been gained and exciting
practical developments have taken place both driven by novel applications that are constantly
emerging. This book presents latest research results in the domain of Characterization of
Materials by spectral characteristics of UV (240 nm) to IR (14 µm) multispectral image
analysis X-Ray polarimetry and microscopy.
