This book highlights what is now achievable in terms of materials characterization with the new
generation of cold-field emission scanning electron microscopes applied to real materials at
high spatial resolution. It discusses advanced scanning electron microscopes scanning-
transmission electron microscopes (SEM STEM) simulation and post-processing techniques at high
spatial resolution in the fields of nanomaterials metallurgy geology and more. These
microscopes now offer improved performance at very low landing voltage and high -beam probe
current stability combined with a routine transmission mode capability that can compete with
the (scanning-) transmission electron microscopes (STEM -TEM) historically run at higher beam
accelerating voltage
