EAN: 9783031797842

SYNTHESIS LECTURES ON DIGITAL CIRCUITS & SYSTEM...

An Introduction to Logic Circuit Testing provides a detailed coverage of techniques for test
generation and testable design of digital electronic circuits systems. The material covered in
the book should be sufficient for a course  or part of a course  in digital circuit testing for
senior-level undergraduate and first-year graduate students in Electrical Engineering and
Computer Science. The book will also be a valuable resource for engineers working in the
industry. This book has four chapters. Chapter 1 deals with various types of faults that may
occur in very large scale integration (VLSI)-based digital circuits. Chapter 2 introduces the
major concepts of all test generation techniques such as redundancy  fault coverage 
sensitization  and backtracking. Chapter 3 introduces the key concepts of testability  followed
by some ad hoc design-for-testability rules that can be used to enhance testability of
combinational circuits. Chapter 4 deals with test generation and response evaluation techniques
used in BIST (built-in self-test) schemes for VLSI chips.Table of Contents: Introduction  
Fault Detection in Logic Circuits   Design for Testability   Built-in Self-Test   References

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