This book describes the technology of charge-trapping non-volatile memories and their uses. The
authors explain the device physics of each device architecture and provide a concrete
description of the materials involved and the fundamental properties of the technology. Modern
material properties used as charge-trapping layers for new applications are
introduced.Provides a comprehensive overview of the technology for charge-trapping non-volatile
memories Details new architectures and current modeling concepts for non-volatile memory
devices Focuses on conduction through multi-layer gate dielectrics stacks.
