Dermatoscopy has undoubtedly advanced diagnostic accuracy of pigmented and non-pigmented skin
lesions. Pattern analysis is the most powerful of current methods for dermatoscopic diagnosis
but it does present significant challenges to the learning dermatoscopist. We present here an
algorithmic method derived from pattern analysis based on logical analysis of simply defined
geometric features. We consider this presents fewer barriers to the beginner but retains
sufficient power for the most experienced user. Most importantly it provides a better
framework for elevating experience beyond mere anecdote allowing experience to lead to true
expertise.
