This book describes a variety of test generation algorithms for testing crosstalk delay faults
in VLSI circuits. It introduces readers to the various crosstalk effects and describes both
deterministic and simulation-based methods for testing crosstalk delay faults. The book begins
with a focus on currently available crosstalk delay models test generation algorithms for
delay faults and crosstalk delay faults before moving on to deterministic algorithms and
simulation-based algorithms used to test crosstalk delay faults. Given its depth of coverage
the book will be of interest to design engineers and researchers in the field of VLSI Testing.
