Single crystalline µm-sized cantilevers are fabricated out of epitaxially grown Ag thin films
by a lithography-based procedure and are deflected by a nanoindenter system. The microstructure
of the plastically deformed cantile-vers is investigated using transmission Kikuchi diffraction
(TKD) on the cantilever cross section. 3D discrete dislocation dynamics simulations (DDD) are
performed for further analysis. A mechanism to explain the formation of dislocation networks
upon loading is suggested.
